The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 1997

Filed:

May. 10, 1994
Applicant:
Inventors:

Rika Baba, Kokubunji, JP;

Ken Ueda, Ome, JP;

Yoichi Onodera, Asaka, JP;

Keiji Umetani, Hino, JP;

Hisatake Yokouchi, Tokyo, JP;

Shigekazu Hara, Noda, JP;

Tomoharu Kajiyama, Koganei, JP;

Fumitaka Takahashi, Toride, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H05G / ;
U.S. Cl.
CPC ...
378 982 ; 348634 ;
Abstract

In order to image an object larger than a field of view for observation, imaging is effected by dividing it into several times and pictures thus imaged are synthesized to constitute a whole image. In order to image several times, only a detecting unit is moved and an X-ray source is substantially fixed with respect to the object. Images thus obtained include a common part of the object and are joined so that the common part are overlapped on each other. In case where an image pick-up tube is included in the detecting unit, the image pick-up tube is made operable, after a period of time necessary for attenuation of microphonic noise has lapsed, measured from a point of time where the detecting unit has been stopped.


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