The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1997
Filed:
Sep. 25, 1995
Kristoph D Krug, Framingham, MA (US);
William F Aitkenhead, Sharon, MA (US);
Richard F Eilbert, Lincoln, MA (US);
Jeffrey H Stillson, Nashua, NH (US);
Jay A Stein, Framingham, MA (US);
Vivid Technologies, Inc., Woburn, MA (US);
Abstract
An X-ray inspection device for detecting a specific material of interest (typically contraband, for example, weapons, drugs, money, explosives) in items of various sizes and shapes includes an X-ray source system located at an inspection region and constructed to expose the examined item to at least one beam of X-ray radiation, one or more x-ray detection systems located at the inspection region and constructed to detect x-ray radiation modified by the examined item. The X-ray inspection device also includes one or more dimension detectors constructed to measure a selected dimension of the examined item, an interface system connected to receive X-ray data and dimension data, and a computer programmed to utilize the data for recognition of the specific material of interest and to indicate its presence in the examined item. The X-ray detection systems detect transmitted and/or scattered X-ray radiation utilizing several different geometries. There may be one or more X-ray back-scatter detection systems, or one or more X-ray forward-scatter detection systems detecting X-ray radiation scattered at different angles from different surfaces of the examined item. Each detection system includes one or more arrays of X-ray detectors arranged in a linear, circular or semi-spherical geometry. Each detection system also may be connected to a displacement unit constructed and arranged to move or rotate the detector array to a selected position relative to the inspection region and the examined item.