The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1997
Filed:
Sep. 12, 1995
William G Tong, San Diego, CA (US);
San Diego State University Foundation, San Diego, CA (US);
Abstract
A method and apparatus using either two or three input laser beams in a nonlinear degenerate four-wave mixing arrangement for ultrasensative analytical measurements of an analyte. In accordance with a first embodiment of the present invention, a two input beam F-D4WM arrangement is used to generate two phase conjugate signal beams. The input beams are narrowly focused to intersect within a very small volume of an analyte. The analyte may be in any physical state (e.g., liquid, solid, or gas). The intensity of the signal beam is used to detect trace concentrations of particular substances. The beam spot of each of the input beams can be focused to less than 34 .mu.m, thus allowing the present invention to directly focus the input beams within a capillary tube of a HPCE or a column of a HPLC system. In accordance with the second embodiment of the present invention, the input laser beams of a F-D4WM method are directed to points on a lens by immobilized fiber optic cables. In accordance with a third embodiment of the present invention, a three input beam B-D4WM method is used in which the three input laser beams are directed by an immobilized fiber optic cable.