The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1997
Filed:
Apr. 27, 1995
Andrei Csipkes, Lawrenceville, GA (US);
John M Palmquist, Lilburn, GA (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A self-calibration system and method (125) determines the adequacy of an interferometer angle .phi. and surface curvatures in an inspection system (90). The inspection system (90) can contactlessly measure the disparity between two surfaces, such as the undercut or protrusion of an optical fiber (26) relative to a surrounding support material (36) at the endface (79) of an optical fiber termination (37). The inspection system (90) measures an offset of the fringe (113') in the image over the target (25') in the image (111a, 111b, 111c) in order to determine the disparity. In structure, the inspection system (90) has a measurement apparatus (91) with an interferometer (98) situated at the angle .phi. relative to the target (82) controlled by a machine vision system (92) for determining the degree of disparity. Further, the machine vision system (92) preferably employs the self-calibration system and method (125).