The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 1997

Filed:

Oct. 07, 1994
Applicant:
Inventors:

Etsuji Yamamoto, Akishima, JP;

Hisaaki Ochi, Kodaira, JP;

Hiroyuki Itagaki, Kokubunji, JP;

Yukari Onodera, Asaka, JP;

Hiroyuki Takeuchi, Kashiwa, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
324318 ; 324319 ;
Abstract

An inspection apparatus using magnetic resonance includes magnetic field generators for generating a static magnetic field, a gradient magnetic field and a radio frequency magnetic field, respectively, a signal detector for detecting magnetic resonance signals from an inspected object, a computer for executing arithmetic operations for detection signals from the signal detector and an output device of the result of the arithmetic operations by the computer. The gradient magnetic field generator includes first and second gradient coils, the first gradient coil is a coil fixed to a magnet for generating a static magnetic field, the second gradient coil is a movable coil, and the magnetic field generated by the second gradient coil at a conducting portion of the magnet is offset by the magnetic field generated by the first gradient coil. According to this construction, an eddy current that occurs with the time change of the gradient magnetic field can be reduced.


Find Patent Forward Citations

Loading…