The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1997
Filed:
Jun. 07, 1995
Applicant:
Inventors:
Kenneth K Colson, Dallas, TX (US);
Bryan S Reese, Mesquite, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
250330 ; 250332 ; 364484 ;
Abstract
With a controlled scanning device (5, 6, 7), such as a FLIR, the scene which provides a modulated source is scanned with the scanning frequency being changed. This results in scanning of the scene with two different known scanning frequencies. By knowing the change in sampling frequency and correlating the changes in the Fourier frequency results in a spectrum analyzer (13), the frequency of the modulated source, including a source modulated at frequencies higher than the sampling rate of the sensor, is remotely measured.