The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1997
Filed:
Oct. 20, 1995
Applicant:
Inventors:
Mitsuchika Saito, Kawasaki, JP;
You-Wen Yi, Yokohama, JP;
Assignee:
Hewlett-Packard Company, Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ; G11B / ;
U.S. Cl.
CPC ...
250306 ; 369126 ;
Abstract
A probe apparatus includes a probe group supporting member having a substrate on which probes having conductive needles are formed. The main bodies of the probes are constructed from composite beams, e.g. L-shaped beams, formed by joining a plurality of arms, e.g. first and second arms, which extend from the substrate of the probe group supporting member, and which overhang the substrate in a direction parallel to the surface of the substrate. The conductive needles are attached perpendicular to the substrate surface at a selected point on each of the composite beams.