The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 04, 1997

Filed:

Jul. 15, 1994
Applicant:
Inventors:

Shigeru Hosoi, Hamamatsu, JP;

Tadashi Fukami, Hamamatsu, JP;

Akihiko Tsuji, Hamamatsu, JP;

Assignee:

Hamamatsu Photonics K.K., Hamamatsu, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 8208 ; 422 681 ; 422 8205 ; 435-6 ; 435 912 ; 4352872 ; 4352887 ; 935 87 ;
Abstract

An apparatus for detecting denaturation of a nucleic acid, including: denaturation condition controlling element for controlling condition of denaturation under which a double-strand nucleic acid is separated into a first single-strand nucleic acid and a second single-strand nucleic acid; excitation light irradiation source for irradiating the double-strand nucleic acid before denaturation, and the first single-strand nucleic acid and second single-strand nucleic acid after the denaturation; fluorescence detection monitor for detecting fluorescence emission based on the excitation light irradiation; and processing element for receiving, storing and processing a signal supplied from the fluorescence detection monitor.


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