The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 04, 1997
Filed:
Sep. 23, 1994
Edward V Sullivan, Huntington Station, NY (US);
Louis G Casagrande, Malverne, NY (US);
Fred Edelstein, Hauppauge, NY (US);
John M Papazian, Great Neck, NY (US);
Grumman Aerospace Corporation, Los Angeles, CA (US);
Abstract
A controlled low temperature chamber for a microscope has a vacuum chamber in a housing. The housing has a top panel and a bottom panel. A mounting in the chamber mounts a sample in a manner whereby the sample is microscopically observable. The mounting includes a base member, a pair of spaced supports extending perpendicularly from the base member and a pair of spaced platforms supported by the supports. Each of the platforms has an upper surface on which the sample rests and a spaced undersurface beneath the sample. A temperature control system maintains a specified temperature in the chamber, applies a controlled temperature gradient on the sample and moves the gradient along the sample in a controlled manner, thereby directionally solidifying and melting the sample, as desired.