The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 28, 1997

Filed:

Oct. 05, 1995
Applicant:
Inventors:

Kenzo Obata, Okazaki, JP;

Yosimi Kitazumi, Chiryu, JP;

Takeshi Watanabe, Kariya, JP;

Kouji Teramae, Kariya, JP;

Tadao Nojiri, Oubu, JP;

Assignee:

Nippondenso Co., Ltd., Kariya, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
235455 ; 235462 ;
Abstract

To accurately read optical information more than an opening diameter of a read opening without the read opening contacted with a reading object, in a reader for reading a bar code by irradiating light from a light source to a bar-code label, converging the reflected light through a mirror and a stop by a lens and focusing the converged light on a line image sensor with a shutter, a wavelength detector for detecting a wavelength of the reflected light and a light guide for irradiating light spots indicative of a readable range to the label are provided. Whether a reading state is in a contact reading state in which a read opening contacts the label or in a noncontact reading state in which the read opening separates from the label is determined based on a wavelength of the reflected light detected by the wavelength detector. A light emission quantity and a shutter speed are controlled so as to keep an incident light quantity to the image sensor at an optimum value on a basis of the decided result and reflected light intensity obtained by integrating a line sensor output.


Find Patent Forward Citations

Loading…