The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1997
Filed:
Feb. 28, 1995
Mark A Connell, Los Gatos, CA (US);
Pure Atria Corporation, Sunnyvale, CA (US);
Abstract
A method for testing programs running under a Graphic User Interface (GUI) is provided. The method is especially adapted to work with GUI's operating in a network based display architecture, such as the X11 server release of X Window. The invention provides a mechanism to test several GUI based programs simultaneously while also allowing normal interactive workstation activities to continue. The invention does not require the use of a special X11 server, or the relinking of tested code. The invention may operate using either of two approaches, depending on the capabilities of the window system being used. The first approach uses a mechanism that duplicates the contents of a window into off screen storage. Since this memory copy of a window is guaranteed to be identical to the on screen window, it can be read in place of the screen contents to test for proper drawing. In the case of systems which do not support a memory resident copy of screen windows, the tester automatically places the correct window on top of all others. Since there may still be conflicts if there are multiply copies of the tester running, as can happen when more than one tester may be trying to place the windows on top of the others at the same time, a locking mechanism is provided for the screen. This mechanism prevents a window from one test from obscuring a window being captured for another test.