The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1997
Filed:
Jul. 19, 1991
William R Krenik, Garland, TX (US);
Louis J Izzi, Plano, TX (US);
Chenwei J Yin, Richardson, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Test circuitry (90) is provided which includes a multiplexer (118) for selectively receiving multiple bit control words defining test functions to be executed by said test circuitry and for outputting data from said test circuitry. A plurality of digital data inputs (96) are provided for receiving multiple bit words of digital data and a plurality of analog data inputs (98) are provided for receiving analog data. A register (120) is coupled to multiplexer (118) for storing a one of the multiple bit words received by multiplexer (118). Control circuitry (122) is coupled to register (120) for controlling execution of the test function defined by the control word being held in register (120). First test circuitry (112) is coupled to digital data inputs (96) and control circuitry (122) for passing digital data words received at digital data inputs (96) to multiplexer (118) for output in response to a first control word of said control words being held in register (120).