The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 21, 1997
Filed:
Feb. 23, 1995
Nobuaki Usui, Tokyo, JP;
Hiroki Fujimoto, Tenjinkitamachi, JP;
Kazutaka Taniguchi, Tenjinkitamachi, JP;
Atsushi Imamura, Tenjinkitamachi, JP;
Abstract
There is provided a model where the illuminance of reflected light from the print is expressed with a linear combination of the illuminance of specular reflection light and that of internal reflection light. On the basis of the model, three methods are applicable to compute the colors of a print disposed in the three-dimensional space. In the first method, a specular reflection coefficient and an internal reflection coefficient, which are depending upon the wavelength, are interpolated by an angle of reflection .theta. and an angle of deviation .rho., and the illuminance spectrum of the reflected light is subsequently determined (step S2). Tristimulus values X, Y, and Z are then determined by integration of the illuminance spectrum according to the color matching functions (step S3). In the second method, the tristimulus values are determined for the specular reflection light, the internal reflection light, and the environmental light, respectively, and then interpolated by the reflection angle .theta. and the deviation angle .rho. (step S4). In the third method, the chromaticity coordinates are determined respectively for the specular reflection light, the internal reflection light, and the environmental light, and then interpolated by the reflection angle .theta. and the deviation angle .rho. (step S5).