The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 1997

Filed:

Dec. 19, 1994
Applicant:
Inventor:

Walter E Donovan, Milpitas, CA (US);

Assignee:

Sun Microsystems, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
395130 ; 395125 ;
Abstract

A computer graphics system includes a texel value generator capably of generating texel values using a minimal amount of computationally intensive divisions while maintaining a selectable texel accuracy criteria along a scan line. This is accomplished by adaptively selecting divisional points which delineate the scan line segments along each scan line such that the divisional points are as widely spaced as possible without exceeding the selected texel accuracy criteria. Having selected the texel accuracy criteria, such as a texel error bound optimally spaced, divisional points along the scan lines are selected as a function of the selected accuracy criteria. In general, since texture gradients are not evenly distributed over the surface of a given object and texture variations are present between different objects of the image, it is advantageous to adaptively select division points one at a time, skipping as many pixels in between divisional points as the local texture gradient will allow. Accurate texel values are computed at these divisional points and also at the end points of the scan line. Approximate texel values are then computed for the pixels located between adjacent pair of divisional points along the scan line using a suitable scheme such as linear interpolation.


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