The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 14, 1997

Filed:

Nov. 18, 1994
Applicant:
Inventors:

Philip Bowles, Carmel, IN (US);

Eric Duff, San Diego, CA (US);

Dale D Thayer, San Diego, CA (US);

Assignee:

ThermoSpectra Corporation, Franklin, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
378 58 ; 378-4 ; 378 986 ;
Abstract

A method and apparatus are provided for imaging obscured areas of a test object. The apparatus includes an x-ray source having a cathode for producing a steerable electron beam. A controller directs the electron beam to predetermined locations on a target anode. The user may flexibly select appropriate predetermined positions. The predetermined locations may be obtained from the geometry of an obscuration. A detector receives x-rays that are transmitted through the test object from each of the predetermined locations, and produces images corresponding to each of the predetermined locations. The images are digitized and may be combined to produce an unobscured image of a region of interest.


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