The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1997
Filed:
Nov. 28, 1994
Paul M Kinzelman, Hudson, MA (US);
Nicholas A Warchol, Boxborough, MA (US);
Digital Equipment Corporation, Maynard, MA (US);
Abstract
A method of testing an integrated circuit design includes the steps of providing a logical model of an integrated circuit, having a plurality of data ports, providing at least two simulators, the first simulator coupled to a first data port of the integrated circuit model, and the second simulator coupled to a second different data ports of said integrated circuit model. The further includes the steps of providing an instruction stream to the first and second simulators, the instruction stream including at least two instruction threads corresponding to the at least two simulators, the simulators providing signals to the data ports in accordance with instructions provided from each of the instruction threads. In addition, the method further includes the step of delaying the first simulator from processing its corresponding instruction thread until dependencies between instruction threads have been satisfied.