The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1997
Filed:
Mar. 14, 1995
Gunther Rodel, Owingen, DE;
Bernhard Radziuk, Frickingen, DE;
Michael Zeiher, Owingen, DE;
Herbert Stenz, Ueberlingen, DE;
Bodenseewerk Perkin-Elmer GmbH, Uberlingen, DE;
Abstract
The invention relates to a multielement atomic absorption spectrometer for simultaneously performing measurements for determining both one element and a plurality of elements under optimum conditions. The atomic absorption spectrometer comprises at least two lamps respectively emitting lines of at least one analyte element, a furnace heating the analyte sample into its atomized state, at least one optical dispersion element having an entrance slit arranged upstream thereof, detector elements, as well as means for passing radiation emanating from the lamps through the furnace, through the entrance slit and the dispersion element to the detector elements, and measuring means. The spectrometer is characterized in that there are provided replaceable optical reflection means which can selectively be moved into the optical path of the lamps in such a manner that the radiation emanating from one, two or a plurality of lamps can be passed through the furnace at the same time, that the dispersion element for producing a two-dimensional dispersion spectrum comprises an echelle grating and a dispersion prism, and that the detector elements are formed by semiconductor photodiodes arranged in one plane. The invention includes a measurement method for further increasing the accuracy of measurements regarding the measurement of one element and the simultaneous measurement of a plurality of elements.