The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1997
Filed:
Oct. 21, 1994
Applicant:
Inventors:
Assignee:
Hitachi, Ltd., , JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356 73 ;
Abstract
A flow type particle image analyzing method and apparatus in which high-speed and high-precision image analysis can be achieved with a simple configuration are realized. A flow chamber is structured so that the dimension of the sample fluid in a direction substantially orthogonal to the direction of the light beam remains substantially constant in a direction of flow in an imaging zone. Furthermore, when particles have small diameters, a power for imaging is set to a fixed high value. When particles have large diameters, the thickness of a sample fluid is increased in order to provide a sufficient number of sample particles. Accordingly, no switching operation of an optical systems is required.