The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1997
Filed:
Jan. 28, 1988
Robert J Vidmar, Stanford, CA (US);
Donald J Eckstrom, Portola Valley, CA (US);
Joseph J Eash, San Carlos, CA (US);
Walter G Chestnut, Foster City, CA (US);
SRI International, Menlo Park, CA (US);
Abstract
A system (20) for broadband electromagnetic absorption in an anechoic chamber (22) has walls (24) of the chamber (22) forming a sealed space. A plurality of ionization sources (30) are mounted on an inside surface of the walls (24), facing the sealed space (28), with a spacing to give one ionization source/m.sup.2 of chamber (22) surface. An electron beam source (32) is connected to the ionization sources (30). A source (36) of helium gas is connected to supply the helium to the space (28). An electronic unit (42) under test is inside the anechoic chamber, and is connected to a test system (44). The test system (44) is also connected to the electron beam source (32). The ionization sources (30) generate a helium plasma in the space (28) by pulsed operation of the electron beam source (32). Timing signals are supplied by the synchronizer (52) to electron-beam source (32) and to the test system (44), so that test signals are supplied by the test system (44) to the unit (42) under test and outputs from the unit (42) are supplied to the test system (44) during an approximately 200 .mu.second low-noise portion of the helium plasma afterglow following energization of the ionization sources (30). Electromagnetic waves generated by the unit (42) in the chamber (22) during the test are absorbed by the helium plasma, so that the outputs from the unit (42) do not include any substantial interference from reflected electromagnetic waves in the chamber (22).