The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 14, 1997
Filed:
Nov. 13, 1995
Applicant:
Inventors:
Assignee:
Murata Kikai Kabushiki Kaisha, Kyoto, JP;
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G06F / ;
U.S. Cl.
CPC ...
73160 ; 57265 ; 36447014 ; 364552 ; 364507 ;
Abstract
A yarn unevenness information analyzing apparatus which can perform an analysis of periodic yarn unevennesses without being restricted by another analysis of non-periodic yarn unevennesses. Signals from a large number of yarn evenness detectors are inputted to a CPU for yarn unevenness analysis by way of a first switch for changing over the signals in a short period to successively output the signals and a second switch for changing over the signals in a long period to successively output the signals.