The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 1997
Filed:
Oct. 24, 1994
Applicant:
Inventor:
Moishe Garfinkle, Philadelphia, PA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356345 ;
Abstract
An imaging interferometer is disclosed in which incident rays are focused by separate tangential and sagittal plano-cylindrical ribbon reflectors aligned with a common optical axis, with rotation of the interferometer about its optical axis allowing the entire object field to be scanned, thereby dispensing entirely with the circular aperture. In this manner high resolutions and wavefront continuity can be achieved without the weight or complications associated with single or multiple circular apertures.