The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Dec. 12, 1994
Applicant:
Inventors:

Tomoaki Nanko, Tokyo, JP;

Takeo Tanaami, Tokyo, JP;

Kenta Mikuriya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356356 ;
Abstract

An interference spectrometer which causes an interference by dividing an output light from a light source into two optical paths and by changing the length of each optical path, and which comprises a moving mirror for changing the optical path lengths, position detecting means for detecting the position of the moving mirror and driving control means for controlling the position of the moving mirror, based on the output from the position detecting means. The spectrometer utilizes leaf springs to support the moving mirror, and the driving control means is driven at the natural frequency of the combined moving mirror and leaf springs and based on the output of the position detecting means. Advantageously, the invention has improved vibration resistance and improved power consumption.


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