The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 1997
Filed:
Nov. 14, 1994
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
A method for correcting an instrumental error due to wavelength error of a spectroscope of an optical analyzer for measuring an optical density reflected from or transmitted through a dry analysis element. One standard color plate having a standard optical density OD.sub.ST is measured by an optical analyzer to be corrected to obtain an measured value OD.sub.M. A measured optical density OD.sub.S of the element applied with a sample through the optical analyzer to be corrected is corrected by using a ratio of OD.sub.M /OD.sub.ST to obtain a corrected measured value OD.sub.C of the sample. The standard color plate to be used contains an indicator dye contained in the non-reacted dry analysis element or a dye having an absorption spectrum same as or similar to that of the indicator dye in the measurement wavelength range. Another correction method in consideration of a layer coefficient of a dry analysis element is also provided.