The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Mar. 08, 1995
Applicant:
Inventor:

Richard L Fedor, Mantua, OH (US);

Assignee:

Alltrista Corporation, Muncie, IN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; H04N / ; H04N / ;
U.S. Cl.
CPC ...
356240 ; 359711 ; 2502 / ; 382142 ; 348127 ;
Abstract

The present invention provides a machine vision inspection system for inspecting the flanges of metal containers that can reliably detect flange defects as small as 0.010 to 0.012 inches. The inspection device comprises apparatus for producing an enlarged image of selected portions of the flange and apparatus for capturing and processing the image. The apparatus for producing the enlarged image includes an annular lens positioned between the flange and the producing apparatus. The invention also provides a method for inspecting a flange of an article, such as a can, for defects. The method comprises the steps of directing light onto the flange of the article from a light source, forming light rays reflected from the flange into a radially expanded image of the flange by positioning an annular lens to redirect reflected light rays into the radially expanded image, and providing apparatus for capturing and processing the image to inspect the flange for defects. By providing an annular lens positioned between the flange and the camera, the present invention enlarges the image of the flange and any defects relative to a pixel of an inspection system. Increasing the effective size of a defect to extend outside of a single pixel increases the effective resolution of the system permitting the detection of smaller defects in the flange of a metal container.


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