The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Nov. 30, 1993
Applicant:
Inventor:

Raimo E Sepponen, Helsinki, FI;

Assignee:

Picker Nordstar Inc., Helsinki, FI;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V / ; G01V / ; A61B / ; A61B / ;
U.S. Cl.
CPC ...
324306 ; 324307 ; 324309 ; 1286533 ;
Abstract

The invention relates to a method for examination of motion of material employing magnetic resonance imaging methods. A magnetic field, which is referred as an auxiliary field is applied over the first area of the object, this auxiliary field is arranged to get smaller as one moves from the first area to the second area, referred as the area to be examined. Partially simultaneously with the auxiliary field a radio frequency pulse, AHP-pulse, is applied on the object, the frequency of the AHP-pulse is the Larmor-frequency corresponding to the strength of the magnetic field in the area to be examined. The length of the AHP-pulse corresponds to the time, which is required for the material to move from the first area to the area to be examined.


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