The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Aug. 11, 1994
Applicant:
Inventors:

James P Vesenka, Ames, IA (US);

Richard K Miller, Ames, IA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
73105 ;
Abstract

A method of reconstructing the shape of an atomic force microscope. The shape of the probe, which is represented by a tip function, is derived from an image taken of a colloidal gold ball by the atomic force microscope. Since the size and shape of the colloidal gold ball is known, the probe shape can readily be determined. After the probe shape has been determined, it is possible to deconvolve or enhance the image of a target sample. This is done by removing the effect of the probe from the target sample image. Further, it is also possible to co-adsorb the colloidal gold balls with the target sample molecules to allow the simultaneous determination of the probe shape and the sample molecule shape.


Find Patent Forward Citations

Vesenka, James. (1997). Reconstructing the shape of an atomic force microscope probe (U.S. Patent No. 5591903). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5591903

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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