The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Nov. 14, 1994
Applicant:
Inventors:

Hideo Katoh, Amagasaki, JP;

Kenji Nakamura, Amagasaki, JP;

Shinji Satomura, Amagasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
435-71 ; 435-79 ; 435 18 ; 435973 ; 436827 ; 530412 ; 530413 ;
Abstract

The degree of a structure change of the sugar chain of a glycoprotein caused by a disease can be measured with high precision rapidly by separating and measuring two or more forms of glycoproteins which are different in sugar chain structure but have substantially the same protein structure, by using a combination of a lectin capable of recognizing the specific sugar chain structure of at least one of these glycoprotein analytes to be measured, and a first antibody which has a property of binding to all the glycoprotein analytes but is kept from binding to glycoprotein analyte(s) having the lectin attached thereto; and separating and measuring glycoprotein analyte(s) having the first antibody attached thereto and glycoprotein analyte(s) having no first antibody attached thereto, by utilizing differences in properties between the former glycoprotein analyte(s) and the latter glycoprotein analyte(s).


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