The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 07, 1997

Filed:

Aug. 07, 1995
Applicant:
Inventors:

Naoki Takamiya, Chiba, JP;

Makoto Nakao, Ichikawa, JP;

Akira Yazawa, Matsudo, JP;

Atumi Wakabayashi, Ichikawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B / ;
U.S. Cl.
CPC ...
4283044 ; 4284111 ; 428412 ; 428413 ; 4284231 ; 428458 ; 4284744 ; 4284752 ; 428480 ; 428690 ; 428699 ; 428701 ; 428702 ; 4289088 ; 428913 ;
Abstract

An antireflection film comprised of a transparent base material, a first layer with a refractive index N.sub.1 of 1.45-2.10, adhered onto the base material, and a second layer with a refractive index N.sub.2 at least 0.1 smaller than N.sub.1, adhered onto the first layer. Thickness D.sub.1 (nm) of the first layer is smaller than 0.5.multidot.L.sub.1 /N.sub.1, thickness D.sub.2 (nm) of the second layer is smaller than 0.5.multidot.L.sub.1 /N.sub.2 wherein L.sub.1 is a wavelength (nm) of a visible light, and at least said first layer contains a light absorber having a principal absorbing wavelength L.sub.2 (nm) satisfying the formula:


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