The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 1996

Filed:

Dec. 21, 1992
Applicant:
Inventors:

Tomohiro Murata, Yokohama, JP;

Kenzo Kurihara, Tokyo, JP;

Kazuhiro Kawashima, Yokohama, JP;

Mitsuaki Niida, Kanagawa-ken, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395181 ; 369 54 ; 39518204 ;
Abstract

A disk controller itself performs the serial inspection process in the following way. It divides a track into a current track group directly available for an external computer and a spare track group available for the disk controller independently of the external computer before registering the groups in it. It also automatically selects a track available in the spare track group as an alternative track. It further copies to the alternative track data recorded on a current track to be inspected. In turn, the disk controller writes a test pattern on the current track. With this, it detects a defect position on a surface of a recording medium of the current track. It also registers the defect position detected on the surface of the recording medium to the current track. It further copies the data having been copied on the alternative track to the current track.


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