The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1996
Filed:
Nov. 15, 1995
Gregg Granville, New Boston, NH (US);
J Peter Glasson, Durham, NH (US);
Metronics, Inc., Bedford, NH (US);
Abstract
An apparatus and method for an object measurement system is described which may be utilized in the inspection and measurement of various objects so as to obtain information regarding their features, dimensional measurements and tolerances. Various devices and methods for data point location and data entry are described which may be utilized in either manual and/or automatic modes of system operation. Input data is monitored so as to prevent erroneous data from being utilized and indication means are provided to notify a user or operator when erroneous data has been entered into the system. The present invention also provides a means by which the user or operator may enter point location data without having to preselect a feature type which is to be inspected and/or measured. The present invention also provides an apparatus and method for processing the point location data so as to determine the feature type therefrom within pre-specified error limits and without user pre-selection and for resolving ambiguities which may arise in the course of such processing. The user or operator may also override system operation if the feature type does not match the user's or operator's expected result. The system provides extensive user interaction capabilities and methods.