The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 1996

Filed:

Mar. 24, 1995
Applicant:
Inventors:

William Chapman, Scottsdale, AZ (US);

Gwo-Jer Chang, Mesa, AZ (US);

Emerald Hwang, Tempe, AZ (US);

James Holt, Del Valle, TX (US);

Lee Howington, Austin, TX (US);

James Chalmers, Pflugerville, TX (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364550 ; 36455101 ;
Abstract

A method for generically describing measured results which includes defining a class of entities to be measured, and a set of criteria which distinguish entities within the class of entities to be measured. A computer display format is dynamically configured based on the set of criteria. The set of criteria is displayed on the computer display according to the computer display format. The values related to an individual entity are interactively specified. The set of measurements related to class of entities to be measured is displayed on the computer display screen and are associated with the set of criteria.


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