The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 31, 1996

Filed:

Apr. 06, 1995
Applicant:
Inventors:

Paul A Frank, Albany, NY (US);

Donald T McGrath, Scotia, NY (US);

Daniel A Staver, Scotia, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241581 ; 324 731 ; 324763 ;
Abstract

A field-testable integrated circuit that includes a plurality of analog signal channels for receiving a respective analog signal during a normal mode of operation is provided. Individual test circuits are built-in within the integrated circuit for selecting respective ones of the plurality of channels to receive predetermined reference signals during a test mode of operation while uninterruptedly providing the normal mode of operation in any remaining unselected channels. Each test circuit includes a channel decoder responsive to predetermined channel select signals for producing a respective channel decoder output signal. A multiplexer is responsive to predetermined reference select signals and to the decoder output signal for supplying during the test mode of operation a selected one of the predetermined reference signals to the respective analog channel being coupled to the individual test circuit therein. A switching gate is responsive to the respective channel decoder output signal so that during the normal mode of operation the switching gate is in a respective conducting state for allowing the respective analog signal to pass therethrough while during the test mode of operation the switching gate is in a respective nonconductive state for interrupting the respective analog signal from passing therethrough.


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