The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1996
Filed:
Jan. 04, 1995
Dale V Ohmart, Fulshear, TX (US);
Willie B Benitez, III, Wylie, TX (US);
Deogracias D Marrero, Baguio City, PH;
Douglas J Mirizzi, Rosenberg, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method is provided for more efficiently and inexpensively testing semiconductor devices by an automated process of monitoring the performance of the test equipment and certifying that it is working properly, both before and after the actual tests of the devices are conducted. If the automated process can certify that the test equipment was working properly, prior and subsequent to the actual tests of the devices, then it can be assumed that the actual tests were performed correctly and the results are valid. Those devices that 'passed' the actual tests are then ready for the next step in the fabrication process, or typically ready to be shipped to the customer. If the test equipment's performance degrades significantly during the actual tests, then the results of the actual tests are considered invalid. Consequently, the test equipment can be repaired or recalibrated and all of the devices retested.