The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 31, 1996
Filed:
Jun. 05, 1995
Bartley C Johnson, Clayton, MO (US);
John H Belk, St. Louis, MO (US);
McDonnell Douglas Corporation, St. Louis, MO (US);
Abstract
A system and method for absolute, high resolution and accurate strain measurement includes a low-coherence light source (12) transmitting light through a strain sensor (18) and into an interferometer (26). The interferometer (26) has a high-coherence light source (48) that parallels the light from the low-coherence light source (12). The output of the interferometer is detected by a photodetector (46). The photodetector (46) is connected to a phase measuring circuit (30), that is in communication with a controller (28). The controller (28) is also connected to a motor (44) that adjusts the optical path lengths in the interferometer (38). The phase change in the high-coherence source from the fringe pattern (68) of the strain sensor (18) before and after a strain is applied to the device under test is used to determine the strain.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile