The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 1996
Filed:
Oct. 26, 1992
Tsuneo Nakata, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
A method for generating a test pattern for use with a scan circuit utilized in detecting a degenerative failure in a synchronous sequential circuit including a memory element unit, having a scan register, and a combination circuit unit for receiving an external input and inputting a value from the memory element unit, and for supplying an external output and outputting a value to the memory element unit. The method includes generating, for an undetected failure, a test pattern for use in a combinational circuit. The method also includes generating a test pattern series for detecting a different failure by observing its external output value and by changing the external input value with the value set in a scan register of the memory element unit.