The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1996

Filed:

Jul. 24, 1991
Applicant:
Inventors:

Satoshi Hori, Amagasaki, JP;

Teruyo Omori, Amagasaki, JP;

Makoto Sakagami, Nagoya, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
36455101 ; 364550 ; 364580 ; 395911 ; 395912 ; 395914 ; 395915 ;
Abstract

A fault diagnosis device searches for causes of fault of a device under test via a fault tree having a tree structure corresponding to the hardware organization of the device under test, where the nodes of the fault tree correspond to the units of the device under test. Some of the nodes including the root node have three or more child nodes. A test table associated with each node other than a leaf includes: a description of parameters to be detected by detector units; test conditions with respect to the parameters detected by the detector units; and fault probability table representing the fault probability values and the child node names corresponding to the respective patterns of results of the tests. The whole fault tree may be divided into a main fault tree stored in the main memory and fault branch trees stored in auxiliary memory. Then, the fault branch trees are loaded into the main memory when needed.


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