The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 1996

Filed:

Oct. 25, 1995
Applicant:
Inventors:

Philippe Venier, Grenchen, CH;

Patrick Debergh, Cressier, CH;

Xavier Arreguit, Le Mont/Lausanne, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ; G01B / ;
U.S. Cl.
CPC ...
2502061 ; 2502082 ; 3561412 ;
Abstract

The invention relates to an optoelectronic sensor for measuring the intensity and the direction of incidence of a light beam, the sensor being of the type comprising a matrix of pixels; an optical system designed to form a light spot on the matrix of pixels; and a signal process for determining the geometrical center of the light spot on the matrix, the signal processor constituted by two arrays of connections between the pixels of the matrix, substantially in radii and in concentric circles, the coordinates of the light spot on the matrix giving an image of the azimuth angle and of the elevation angle of the incident light beam, the device also including circuits associated with the two arrays of connections between the pixels to compute the azimuth and elevation coordinates respectively of the incident light beam.


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