The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 1996
Filed:
Nov. 22, 1994
William T Warner, Morgan Hill, CA (US);
Other;
Abstract
The present invention is a method for operating a data processing system to generate a sequence of test states containing a predetermined set of states and/or transitions for use in testing an integrated circuit or the like. The method minimizes the number of additional states and/or transitions contained in the test sequence while preserving any constraints on the sequence of transitions that may be applied to the circuit to be tested. The present invention operates by defining a graph containing the predetermined set of states and/or transitions. The states are the vertices of the graph and the transitions are edges of the graph. The graph is then augmented if needed with additional states and/or transitions. The additional states and/or transitions assure the existence of an Eulerian Path through the graph. The additional states assure that the graph is connected, and that each vertex in the graph, with the possible exception of two vertices, has the same number of inbound and outgoing transitions. The Eulerian Path is then traced to provide a sequence of states that includes the input list of states and/or transitions.