The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 17, 1996

Filed:

Jan. 26, 1995
Applicant:
Inventors:

Peter T Highnam, Austin, TX (US);

Andrew Pieprzak, Houston, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364421 ;
Abstract

A method for 3 dimensional, one pass migration of post stack seismic data is implemented on a massively parallel computer. The quality of the migration and speed of execution makes possible iterative 3D post stack depth migrations. The depth migration method computes in the frequency domain and downward continues one or more frequency planes through all depth levels of interest. For a single frequency, at each depth level, the method extrapolates a shifted position for each x,y position by applying a filter for 2D convolution. A processing component is assigned to each subgrid of x,y spatial positions and the processing components operate concurrently in parallel to determine filter coefficients independently for each x,y spatial position and to extrapolate the x,y shifted positions. The filter coefficients are derived independently at each x,y position by storing a limited table of filter coefficients in local memory of each processing component.


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