The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 1996
Filed:
Dec. 07, 1995
Johannes Van Der Borst, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray window for an X-ray component such as an X-ray detector. Windows of this kind must be as thin as possible so as to minimize X-ray absorption. The known material polypropylene is not available in the desired thickness of the order of 1 .mu.m, and stretching of this material so as to reduce the thickness causes an inadmissible spread in thickness. The material polyethylene naphthalate (PEN) in accordance with the invention is available in the desired thickness and with a much smaller spread in thickness. Furthermore, the window material should exhibit suitable mechanical properties (such as strength, rigidity and tightness) which are not allowed to degrade significantly under the influence of continuously varying circumstances in respect of pressure, temperature and X-rays. In comparison with the known polyethylene terephtalate (PET), PEN in this respect has better properties which satisfy the mechanical requirements.