The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 1996
Filed:
Dec. 23, 1993
Arthur W Vogeley, Jr, Bellevue, WA (US);
Design Systems, Inc., Redmond, WA (US);
Abstract
A method and system for weighing an object as it is carried on a conveyor past an x-ray source. X-rays from the x-ray source pass through the object, are attenuated in proportion to the mass of the object through which they pass, and impinge upon an x-ray detector array. X-ray detector array includes a layer of scintillating material that produces light in response to the intensity of the x-rays and a plurality of photodiodes to detect the light. The intensity of the x-rays received at the x-ray detector array is indicated by signals produced by the photodiodes, which are periodically scanned by a processor. The photodiode signals are each converted to a value representing the average areal density for a volume element extending above the photodiode into the object. Using the average areal density for each volume element and the size of each volume element, the processor determines the mass of the volume element. The entire object is advanced, and the mass of the volume elements in the object are generated and stored. The total mass of an object is determined by summing the masses of the volume elements, and a mass map of an object is generated that represents the location and mass of all of the volume elements in the object.