The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 10, 1996
Filed:
Jun. 14, 1994
Hamid K Aghajan, Stanford, CA (US);
Thomas Kailath, Stanford, CA (US);
The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);
Abstract
Disclosed is a fast and high resolution technique for estimating the skew angle in text document images. Detection of the skew angle is an important step in text processing tasks such as optical character reading (OCR) and computerized filing. The proposed method is based on the application of a recently developed algorithm for estimation of angle of straight lines in a scanned image. The Subspace-Based Line Detection (SLIDE) algorithm formulates the multi-line fitting problem in a special parameter estimation framework such that a signal structure similar to the one in the field of high-resolution sensor array processing is obtained. Then the well-studied techniques in that formalism (e.g., the ESPRIT algorithm) are exploited to produce closed-form and high resolution estimates for line parameters.