The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 1996

Filed:

Jul. 21, 1993
Applicant:
Inventor:

Gregory M Cutler, Cupertino, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356346 ; 356358 ;
Abstract

The present invention concerns an interferometer for measuring wavelengths using a rotating periscope and a laser of known wavelength. The rotating periscope uses parallel reflectors mounted on a rotating platform. A beam splitter splits an input beam into two optical paths which reflect off the rotating periscope and back reflectors so that the paths will have a path length difference. The beam splitter splits a reference beam from the laser with known wavelength into two reference optical paths which counter-propagate the input beam's optical paths. The light is recombined in a beam splitter to form an interference signal and a reference interference signal so that the input beam's wavelength can be determined.


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