The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 1996

Filed:

Nov. 29, 1994
Applicant:
Inventor:

Norihiko Samoto, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L / ;
U.S. Cl.
CPC ...
437 40 ; 437 39 ; 437 41 ; 437187 ; 437203 ; 437228 ; 437229 ; 437912 ; 437944 ; 148D / ; 430296 ; 430312 ; 430407 ;
Abstract

A method of forming a T-shaped, cross-sectional pattern that enables upper and lower parts of the T-shaped patten using in first and second resist films layers independent of an existence of a mixing layer. A first resist film that is not sensitive to UV light is formed on or over a substrate and a first window is formed on or over a substrate and a first window is formed in the first resist film. The first window corresponds to the lower part of the T-shaped pattern. Next, a second resist film is formed on the first resist film to cover the first window. The second resist film is exposed to UV light to form a given image in the second resist film and is developed to form a second window in the second resist film. The second window corresponds to the upper part of the pattern.


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