The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 10, 1996

Filed:

Dec. 02, 1993
Applicant:
Inventors:

Ian T Magrath, Silver Spring, MD (US);

Bruce Shiramizu, Pacifica, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q / ; C12P / ; C07H / ;
U.S. Cl.
CPC ...
435-6 ; 435 912 ; 536 2431 ; 536 2433 ;
Abstract

A sensitive method for identifying chromosomal breakpoints flanked by repeat sequences, through amplification by polymerase chain reaction, is described. The application of the method to the detection of Burkitt's lymphoma cells is demonstrated.


Find Patent Forward Citations

Magrath, Ian. (1996). Sensitive method for localizing chromosomal breakpoints (U.S. Patent No. 5582973). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5582973

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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