The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1996
Filed:
Sep. 16, 1994
Gilles Le Saux, Paris, FR;
Patrick Bertrand, Issy-Les-Moulineaux, FR;
Xavier Lippens, Paris, FR;
Christophe Lafay, Paris, FR;
Essilor International, , FR;
Abstract
A method and device for measurement of the geometrical or optical structure of an optical component such as a lens or a mold for making lens are provided. The method comprises the steps of illuminating the optical component to be measured with incident light having a known wavefront, measuring, in a given plane, the maps of the wavefront slopes of the light, after reflection at or transmission by the optical component, and deducing the surface topography or refraction index map of the optical component to be measured from the measurements of the slope maps by the application of at least one calculating procedure. The calculating procedure comprises a step in which a result surface is initialized using a simple starting surface SD' and at least one optimization step; each optimization step involves calculation of the value of a merit function representative of the departure between the result surface and the surface to be measured of the optical component and, minimization of said value varying said result surface, said variation being expressed in the form of at least one intermediate surface S.sub.i.