The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 03, 1996
Filed:
Feb. 08, 1995
Applicant:
Inventor:
Kazuhiro Ohara, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348625 ; 348606 ; 348628 ; 348630 ;
Abstract
A method of improving the sharpness of horizontal edges of an image that has been vertically scaled. The scaled signal, which represents a series of pixel values, is used to derive an aperture correction value (41-46), which is determined by the scaling ratio and an edge factor. This aperture correction value is added to the scaled signal (47), resulting in enhanced pixel values at edges.