The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 1996

Filed:

Apr. 13, 1994
Applicant:
Inventors:

Masao Okayama, Ryugasaki, JP;

Takao Terayama, Ushiku, JP;

Kazuo Honma, Ibaraki-ken, JP;

Hiroshi Ohki, Tsuchiura, JP;

Isao Shindo, Katsuta, JP;

Susumu Kai, Katsuta, JP;

Shigeo Mutou, Hitachiota, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; B65H / ;
U.S. Cl.
CPC ...
422 66 ; 422 63 ; 422 67 ;
Abstract

An analytic test sheet feeder comprises a cylindrical container 11 having an elongated through hole 15 formed in a side wall thereof for receiving a test sheet, a container support 18 which comprises an upper portion having a semi-cylindrical concave surface and a hole 20 formed in a central portion of the concave surface to permit a test sheet descending from the through hole of the container 11 to be taken out therethrough 20, and a test sheet delivering stage 31 which receives and delivers the test sheet descending from the through hole 15.


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