The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 1996

Filed:

Nov. 19, 1993
Applicant:
Inventors:

Takeshi Fujita, Tokyo, JP;

Masakazu Niikura, Tokyo, JP;

Shinji Mitao, Tokyo, JP;

Masataka Suga, Tokyo, JP;

Kohei Hasegawa, Tokyo, JP;

Assignee:

NKK Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C22C / ;
U.S. Cl.
CPC ...
148417 ; 148418 ;
Abstract

Disclosed is an aluminum alloy sheet having a chemical composition of an Si-containing Al--Mg--CU alloy. The aluminum alloy sheet exhibits a streak-shaped modulated structure at a diffraction grating points of an Al--Cu--Mg--system compound in the electron beam diffraction grating image. The above mentioned streak can be generated efficiently when the alloy essentially consists of 1.5 to 3.5% by weight of Mg, 0.3 to 1.0% by weight of Cu, 0.05 to 0.6% by weight of Si, and the balance of Al and inevitable impurities, and the ratio of Mg/Cu is in the range of 2 to 7. The alloy contains 0.01-0.50% of at least one element selected from the group consisting of Sn, Cd, and In.


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