The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 26, 1996

Filed:

Feb. 27, 1996
Applicant:
Inventors:

Willem G Opheij, Eindhoven, NL;

Jozef P Benschop, Eindhoven, NL;

Heidrun Steinhauser, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
369112 ; 369109 ;
Abstract

A device for optically scanning an information plane (2) having tracks (5). Radiation supplied by a radiation source (7) is focused on the information plane by an objective system (8). The beam reflected by the information plane is incident on a dividing element, for example, a grating (12), which divides the beam into two halves along a dividing line (17). Two sub-gratings (15, 16) at both sides of the dividing line, respectively, each form a sub-beam from one half of the beam, which sub-beams are detected by a detection system (10), which produces detection signals therefrom. A focus error signal is generated from the detector signals. According to the invention, modulation of the focus error signal by the track structure will be minimal if the dividing line (17) is located at an angle between 15.degree. and 80.degree. to the direction of the tracks.


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